X-ray Spectrometry

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.

Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.

Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.

《X-ray Spectrometry》是一本由John Wiley and Sons Ltd出版商出版的专业物理与天体物理期刊，该刊创刊于1972年，刊期Bimonthly，该刊已被国际权威数据库SCIE收录。在中科院最新升级版分区表中，该刊分区信息为大类学科：物理与天体物理4区，小类学科：光谱学 4区；在JCR（Journal Citation Reports）分区等级为Q3。该刊发文范围涵盖SPECTROSCOPY等领域，旨在及时、准确、全面地报道国内外SPECTROSCOPY工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等，促进学术交流，鼓励学术创新。2023年影响因子为1.5，平均审稿速度 较慢,6-12周 。